Semiconductor device with high integration

ABSTRACT

The present disclosure may provide a semiconductor device having a stable structure and a low manufacturing degree of the difficulty. The device may include conductive layers and insulating layers which are alternately stacked; a plurality of pillars passing through the conductive layers and the insulating layers; and a plurality of deposition inhibiting patterns, each deposition inhibiting pattern being formed along a portion of an interface between a side-wall of each of the pillars and each of the conductive layers and along a portion of an interface between each of the insulating layers and each of the conductive layers.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a division of U.S. patent application Ser. No.14/980,244 filed on Dec. 28, 2015, which claims priority to Koreanpatent Application No. 10-2015-0103965, filed on Jul. 22, 2015. Thedisclosure of each of the foregoing applications is incorporated hereinby reference in its entirety.

BACKGROUND 1. Field

The present disclosure relates to a semiconductor device and a method ofmanufacturing the same and, in particular, to a 3-dimensionalsemiconductor device and a method of manufacturing the same.

2. Description of the Related Arts

A non-volatile memory device may maintain already-stored data in apower-off state. As a 2D memory device with a single layer memory cellon a silicon substrate has reached a maximum degree in an integrationaspect, a 3-dimensional non-volatile memory device with a verticalmemory cells stack which is formed on a silicon substrate has beensuggested.

The 3-dimensional non-volatile memory device has vertical alternationsof conductive layers and insulating layers in order to achieve a memorycell stack. For example, sacrificial layers and insulating layers arealternated and, then, the sacrificial layers are replaced with theconductive layers. However, it is difficult to properly execute thereplacement process, and damage may occur to neighboring layers due toreaction gases remaining in the conductive layers. This may lower aproduction yield, and performance of the memory device may deteriorate.

SUMMARY

An embodiment is directed to a semiconductor device with a stablestructure and a low manufacturing degree of difficulty, and a method ofmanufacturing the same.

In one aspect of the present disclosure, there is provided asemiconductor device comprising: first and second slit insulatinglayers, each slit insulating layer extending in a first direction; astacked structure including conductive layers and insulating layers,which are alternately stacked and disposed between the first and secondslit insulating layers, wherein the stacked structure includes first,second, and third regions, wherein the first region contacts the firstslit insulating layer, wherein the second region contacts the secondslit insulating layer, wherein the third region is defined between thefirst region and the second region; a plurality of first pillarsarranged in the first direction, each first pillar passing through thefirst region of the stacked structure; a plurality of second pillarsarranged in the first direction, each second pillar passing through thesecond region of the stacked structure; and a plurality of firstdeposition inhibiting patterns, each first deposition inhibiting patternbeing disposed between each of the conductive layers and each of theinsulating layers in the first region, each first deposition inhibitingpattern surrounding at least a portion of a side-wall of each of thefirst pillars.

In one aspect of the present disclosure, there is provided asemiconductor device comprising: conductive layers and insulating layerswhich are alternately stacked; a plurality of pillars passing throughthe conductive layers and the insulating layers; and a plurality ofdeposition inhibiting patterns, each deposition inhibiting pattern beingformed along a portion of an interface between a side-wall of each ofthe pillars and each of the conductive layers and along a portion of aninterface between each of the insulating layers and each of theconductive layers.

In one aspect of the present disclosure, there is provided a method ofmanufacturing a semiconductor device, comprising: alternately formingsacrificial layers and insulating layers; forming a plurality ofpillars, each pillar passing through the sacrificial layers and theinsulating layers; forming a slit, the slit passing through thesacrificial layers and the insulating layers, the slit extending in afirst direction; forming openings by removing the sacrificial layersthrough the slit; forming an deposition inhibiting layer, the depositioninhibiting layer surrounding at least partially a side-wall of each ofthe pillars and each of the insulating layers, the side-wall beingexposed through each of the openings; and forming conductive layersrespectively in the openings.

In accordance with the present disclosure, the gate electrode may beformed using the deposition inhibiting pattern surrounding at least aportion of the side-wall of the pillar. In this way, the gate electrodemay have a high compactness due to containing no voids therein. This maylead to the semiconductor device having a stable structure and a lowmanufacturing degree of the difficulty.

BRIEF DESCRIPTION OF THE DRAWINGS

A brief description of each drawing is provided to more fully understandthe drawings, which is incorporated in the detailed description of thedisclosure.

FIG. 1A is a perspective view of a semiconductor device in accordancewith one implementation of the present disclosure.

FIG. 1B to FIG. 1D illustrate details of the structure of FIG. 1A. FIG.1B is a cross-sectional view of FIG. 1A; FIG. 1C is a plan view takenalong the line III-III′ of FIG. 1B; and FIG. 1D is a plan view takenalong the line IV-IV′ of FIG. 1B.

FIG. 2A is a cross-sectional view of the semiconductor device inaccordance with one implementation of the present disclosure. FIG. 2B isa plan view taken along the line III-III′ of FIG. 2A; FIG. 2C is a planview taken along the line IV-IV′ of FIG. 2A.

FIG. 3A is a perspective view of a semiconductor device in accordancewith one implementation of the present disclosure.

FIG. 3B to FIG. 3D illustrate details of the structure of FIG. 3A. FIG.3B is a cross-sectional view of FIG. 3A; FIG. 3C is a plan view takenalong the line III-III′ of FIG. 3B; and FIG. 3D is a plan view takenalong the line IV-IV′ of FIG. 3B.

FIG. 4A is a cross-sectional view of the semiconductor device inaccordance with one implementation of the present disclosure. FIG. 4B isa plan view taken along the line III-Ill′ of FIG. 4A; FIG. 4C is a planview taken along the line IV-IV′ of FIG. 4A.

FIG. 5A to FIG. 10A and FIG. 5B to FIG. 10B illustrate a method ofmanufacturing a semiconductor device in accordance with oneimplementation of the present disclosure. Each of FIG. 5A to FIG. 10Aillustrates a cross-sectional view. Each of FIG. 5B to FIG. 10Billustrates a plan view.

FIG. 11A, FIG. 11B, FIG. 12A and FIG. 12B illustrate a method ofmanufacturing a semiconductor device in accordance with oneimplementation of the present disclosure. Each of FIG. 11A to FIG. 12Aillustrates a cross-sectional view. Each of FIG. 11B to FIG. 12Billustrates a plan view.

FIG. 13 illustrates a block diagram of a memory system in accordancewith one implementation of the present disclosure.

FIG. 14 illustrates a block diagram of a memory system in accordancewith one implementation of the present disclosure.

FIG. 15 illustrates a block diagram of a computing system in accordancewith one implementation of the present disclosure.

FIG. 16 illustrates a block diagram of a computing system in accordancewith one implementation of the present disclosure.

DETAILED DESCRIPTION

Examples of various embodiments are illustrated in the accompanyingdrawings and are described further below. It will be understood that thediscussion herein is not intended to limit the claims to the specificembodiments described. On the contrary, it is intended to coveralternatives, modifications, and equivalents as may be included withinthe spirit and scope of the present disclosure as defined by theappended claims.

Example embodiments will be described in more detail with reference tothe accompanying drawings. The present disclosure, however, may beembodied in various different forms, and should not be construed asbeing limited to only the illustrated embodiments herein. Rather, theseembodiments are provided as examples so that this disclosure will bethorough and complete, and will fully convey the aspects and features ofthe present disclosure to those skilled in the art.

It will be understood that, although the terms “first”, “second”,“third”, and so on may be used herein to describe various elements,components, regions, layers and/or sections, these elements, components,regions, layers and/or sections should not be limited by these terms.These terms are used to distinguish one element, component, region,layer or section from another element, component, region, layer orsection. Thus, a first element, component, region, layer or sectiondescribed below could be termed a second element, component, region,layer or section, without departing from the spirit and scope of thepresent disclosure.

It will be understood that when an element or layer is referred to asbeing “connected to”, or “coupled to” another element or layer, it canbe directly on, connected to, or coupled to the other element or layer,or one or more intervening elements or layers may be present. Inaddition, it will also be understood that when an element or layer isreferred to as being “between” two elements or layers, it can be theonly element or layer between the two elements or layers, or one or moreintervening elements or layers may also be present.

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting the presentdisclosure. As used herein, the singular forms “a” and “an” are intendedto include the plural forms as well, unless the context clearlyindicates otherwise. It will be further understood that the terms“comprises”, “comprising”, “includes”, and “including” when used in thisspecification, specify the presence of the stated features, integers,operations, elements, and/or components, but do not preclude thepresence or addition of one or more other features, integers,operations, elements, components, and/or groups thereof. As used herein,the term “and/or” includes any and all combinations of one or more ofthe associated listed items. Expression such as “at least one of” whenpreceding a list of elements may modify the entire list of elements andmay not modify the individual elements of the list.

Unless otherwise defined, all terms including technical and scientificterms used herein have the same meaning as commonly understood by one ofordinary skill in the art to which this inventive concept belongs. Itwill be further understood that terms, such as those defined in commonlyused dictionaries, should be interpreted as having a meaning that isconsistent with their meaning in the context of the relevant art andwill not be interpreted in an idealized or overly formal sense unlessexpressly so defined herein.

In the following description, numerous specific details are set forth inorder to provide a thorough understanding of the present disclosure. Thepresent disclosure may be practiced without some or all of thesespecific details. In other instances, well-known process structuresand/or processes have not been described in detail in order not tounnecessarily obscure the present disclosure.

Hereinafter, the various embodiments of the present disclosure will bedescribed in details with reference to attached drawings.

FIG. 1A is a perspective view of a semiconductor device accordance withone implementation of the present disclosure. In this implementation, asingle stacked structure ST may include two pillar rows.

Referring to FIG. 1A, a semiconductor device in accordance with oneimplementation of the present disclosure may include a stacked structureST including conductive layers 11 and insulating layers 12, which arealternately stacked, the pillars 15 passing through the stackedstructure ST, and deposition inhibiting patterns 13 contacting theconductive layers 11.

The pillars 15 may be arranged in a first direction I-I′ and a seconddirection II-II′ which is crossing the first direction I-I′. A pluralityof pillars 15 are included in a single pillar row. In an embodiment,centers of the plurality of pillars 15 are arranged in the firstdirection I-I′.

In another embodiment, the pillars 15 may have a staggered arrangement.That is, centers of adjacent pillars 15 may be arranged in a staggeredmanner in one direction. In yet another example, the pillars 15 may bearranged in a linear manner in the first direction I-I′ (See “A” line),while the pillars 15 may be arranged in a staggered manner in the seconddirection II-II′. In the staggered structure, centers of two neighboringpillars 15 are arranged by a spacing ΔD. In this way, via thearrangement of the pillars 15 in the staggered manner, the pillars mayhave a higher compactness.

The pillars 15 may include a semiconductor material. In one example, thematerial may include silicon (Si), germanium (Ge), etc. The pillars 15may serve as a channel layer for a memory cell, selection transistor,etc. Although not shown in the figure, each of the pillars 15 maycontain an open central region which may be filled with a gap-fillinsulating layer.

When the pillars 15 may serve as a channel layer for a memory cell, amemory layer may be disposed between each of the pillars 15 and each ofthe conductive layers 11. In one example, the memory layer may include atunnel-insulating layer, a data storage layer, and/or a charge-blockinglayer. The data storage layer may include silicon, a nitride, nano-dots,phase-transform materials or the like. When each of the pillars 15 mayserve as a channel layer for a selection transistor, a gate insulatinglayer may disposed between each of the pillars 15 and each of theconductive layers 11. In one example, the gate insulating layer mayinclude oxide, nitride, or the like. The memory layer and the gateinsulating layer may be formed of the same material.

The conductive layers 11 may include a metal. In one example, the metalmay include tungsten W, tungsten nitride WN_(x) or the like. Theconductive layers 11 may serve as a gate electrode for a memory cell, aselection transistor, etc. The insulating layers 12 may include oxide,nitride or the like. The insulating layer 12 may be disposed between thegate electrodes and insulating the gate electrodes from each other.

The deposition inhibiting patterns 13 may, in the course of replacingthe sacrificial layers (not shown) with the conductive layers 11, serveto control a conductive material forming location. The depositioninhibiting patterns 13 may include a non-conductive material, such asnitrogen atoms N, oxygen atoms O or the like. In one example, thedeposition inhibiting patterns 13 may be made of a nitride layer or anoxide layer.

Moreover, each of the deposition inhibiting patterns 13 may surround atleast a portion of a side-wall of each of the pillars 15, and may bedisposed between each of the conductive layers 11 and each of theinsulating layers 12. In one example, each of the deposition inhibitingpatterns 13 may have a cross-section in a “C” shape so as to surround aside-wall of each of the pillars 15 and a surface of each of theconductive layers 11. That is, each of the deposition inhibitingpatterns 13 extends from between each of the conductive layers 11 andeach of the insulating layers 12 to between each of the conductivelayers 11 and the side-wall of each of the pillars 15.

The semiconductor device may include a plurality of the stackedstructures ST. In this case, between the stacked structures ST, slits SLare disposed which are extending in the first direction I-I′. Althoughnot shown in the figure, each of the slits SL may be filled with a slitinsulating layer. The slit insulating layer may fill completely the slitSL or incompletely fill the slit SL so as to form an air gap therein.

The semiconductor device may further include barrier patterns 14 whichare respectively disposed between the conductive layers 11 and theinsulating layers 12 and extend between the conductive layers 11 and thepillars 15. In one example, the barrier patterns 14 may be disposedrespectively between the deposition inhibiting patterns 13 and theinsulating layers 12. Further, the barrier pattern 14 may includetantalum Ta, titanium Ti, tantalum nitride TaN, titanium nitride TiN, orthe like.

FIG. 1B to FIG. 1D illustrate details of the structure of FIG. 1A. FIG.1B is a cross-sectional view of the semiconductor device in accordancewith one implementation of the present disclosure; FIG. 1C is a planview taken along the line III-III′ of FIG. 1B; and FIG. 1D is a planview taken along the line IV-IV′ of FIG. 1B.

Referring to FIG. 1B, the semiconductor device may include first andsecond slit insulating layers SLI1, SLI2, each slit extending in thefirst direction I-I′. Between the first slit insulating layer SLI1 andsecond slit insulating layer SLI2, the stacked structure ST is disposed.Therefore, the stacked structure ST may have one side-wall B contactingthe first slit insulating layer SLI1 and the other side-wall Ccontacting the second slit insulating layer SLI2.

Referring to FIG. 1C, the stacked structure ST may include a firstregion R1 contacting the first slit insulating layer SLI1, a secondregion R2 contacting the second slit insulating layer SLI2, and a thirdregion R3 between the first region R1 and second region R2. The first tothird regions R1 to R3 may have the same or different width.

The first pillars P1 may pass through the first region R1 of the stackedstructure ST and be arranged in the first direction I-I′. The secondpillars P2 may pass through the second region R2 of the stackedstructure ST and may be arranged in the first direction I-I′. A firstrow of the first pillars P1 and a second row of the second pillars P2may be adjacent to each other in the second direction II-II′. The firstpillars P1 may have respective centers offset from the second pillarsP2. Further, the pillars P1 may be located at a boundary between thefirst region R1 and third region R3, while the second pillars P2 may belocated at a boundary between the second region R2 and third region R3.

The first deposition inhibiting patterns 13A may be disposedrespectively between the conductive layers 11 and insulating layers 12in the first region R1. The second deposition inhibiting patterns 13Bmay be disposed respectively between the conductive layers 11 andinsulating layers 12 in the second region R2.

Referring to FIG. 1D, each of the first deposition inhibiting patterns13A may surround a portion of the side-wall of each of the first pillarsP1, respectively. The portion of the side-wall may refer to a portion ofthe side-wall facing the first slit insulating layer SLI1. That is, eachof the first deposition inhibiting patterns 13A may not be formed alonga portion of the side-wall of each of the first pillars P1 facing thesecond pillars P2.

Each of the second deposition inhibiting patterns 13B may surround aportion of a side-wall of each of the second pillars P2. The portion ofthe side-wall surrounded by the second deposition inhibiting pattern 13Bmay refer to a portion of the side-wall facing the second slitinsulating layer SLI2. That is, each of the second deposition inhibitingpatterns 13B may not be formed along a portion of the side-wall of eachof the second pillars P2 facing the first pillars P1.

Referring to FIG. 1B to FIG. 1D, each of the barrier patterns 14 may bedisposed between each of first and second pillars P1, and P2 and each ofthe conductive layers 11, and between each of the conductive layers 11and each of the insulating layers 12. Further, each of the first andsecond deposition inhibiting patterns 13A and 13B may be disposedpartially along an interface between each of the conductive layers 11and each of the barrier patterns 14. In one example, the first andsecond deposition inhibiting patterns 13A and 13B are disposed in thefirst and second regions R1 and R2, respectively. Each of the firstdeposition inhibiting patterns 13A is disposed between each of theconductive layers 11 and each of the barrier patterns 14. Each of thesecond deposition inhibiting patterns 13B is disposed between each ofthe conductive layers 11 and each of the barrier patterns 14.

In the third region R3, there may not be disposed each of the first andsecond deposition inhibiting patterns 13A and 13B. That is, in the thirdregion R3, each of the conductive layers 11 and each of the barrierpatterns 14 maybe in direct contact with each other.

In the above-addressed configuration, each of the first and seconddeposition inhibiting patterns 13A, 13B may surround each of portions ofthe side-walls of the first and second pillars P1, P2, resulting in acompactness of the conductive layers 11 without any voids.

FIG. 2A is a cross-sectional view of the semiconductor device inaccordance with one implementation of the present disclosure. FIG. 2B isa plan view taken along the line III-III′ of FIG. 2A; FIG. 2C is a planview taken along the line IV-IV′ of FIG. 2A. Hereinafter, descriptionsof the same or similar elements as described above may be omitted.

Referring to FIG. 2A to FIG. 2C, first pillars P1 may be disposed in astacked structure ST in the first region R1, and second pillars P2 maybe disposed in the stacked structure ST in the second region R2.Therefore, each of first deposition inhibiting patterns 13A may surroundan entirety of a side-wall of each of the first pillars P1, and each ofsecond deposition inhibiting patterns 13B may surround an entirety of aside-wall of each of the second pillars P2. Further, each of the firstand second deposition inhibiting patterns 13A and 13B may be disposedbetween each of the conductive layers 11 and each of barrier patterns14.

FIG. 3A is a perspective view of a semiconductor device accordance withone implementation of the present disclosure. In this implementation, asingle stacked structure ST may include four pillar rows.

Referring to FIG. 3A, a semiconductor device in accordance with oneimplementation of the present disclosure may include a stacked structureST, pillars 25, and deposition inhibiting patterns 23. In each ofstacked structure ST, conductive layers 21 and insulating layers 22 arevertically and alternately stacked. Pillars 25 pass through the stackedstructure ST and the deposition inhibiting patterns 23 contact theconductive layers 21.

The pillars 25 may be arranged in a first direction I-I′ and a seconddirection II-II′ crossing the first direction I-I′. Centers of thepillars 25 in a single pillar row are aligned in the first directionI-I′. The pillars 25 may have a staggered arrangement in the seconddirection II-II′ so that centers of adjacent pillars 25 are arranged ina staggered manner. In one example, the pillars 25 may be arranged in alinear manner in the first direction I-I′ while the pillars 25 may bearranged in a staggered manner in the second direction II-II′. In thestaggered manner, the pillars 25 may have respective centers offset fromeach other by a spacing ΔD. In this way, the pillars may have a higherintegration.

Barrier patterns 24 may be disposed respectively between the pillars 25and the conductive layers 21 and between the conductive layers 21 andthe insulating layers 22. Further, each of the deposition inhibitingpatterns 23 may surround at least a portion of a side-wall of each ofthe pillars 25 and be disposed partially between each of the conductivelayers 21 and each of the barrier patterns 24. In one example, each ofthe barrier patterns 24 may be disposed between each of the depositioninhibiting patterns 23 and each of the insulating layers 22.

FIG. 3B to FIG. 3D illustrate details of the structure of FIG. 3A. FIG.3B is a cross-sectional view of the semiconductor device in accordancewith one implementation of the present disclosure; FIG. 3C is a planview taken along the line III-III′ of FIG. 3B; and FIG. 3D is a planview taken along the line IV-IV′ of FIG. 3B.

Referring to FIG. 3B, the semiconductor device may include first andsecond slit insulating layers SLI1, and SLI2, each slit layer extendingin the first direction I-I′. The stacked structure ST may be disposedbetween the first slit insulating layer SLI1 and second slit insulatinglayer SLI2. In this way, the stacked structure ST may have one side-wallcontacting the first slit insulating layer SLI1 and the other side-wallcontacting the second slit insulating layer SLI2.

Referring to FIG. 3C, first to fourth pillars P1 to P4 may be arrangedfrom one side-wall to the other side-wall of the stacked structure ST.The first pillars P1 arranged in the first direction I-I′ may form afirst pillar row; the second pillars P2 arranged in the first directionI-I′ may form a second pillar row; the third pillars P3 arranged in thefirst direction I-I′ may form a third pillar row; and the fourth pillarsP4 arranged in the first direction I-I′ may form a fourth pillar row.Further, the first pillars P1 and second pillars P2 adjacent to eachother in the second direction II-II′ may have a staggered arrangement.Likewise, the third pillars P3 and fourth pillars P4 adjacent to eachother in the second direction II-II′ may have a staggered arrangement.The second pillars P2 and third pillars P3 adjacent to each other in thesecond direction II-II′ may have a staggered or linear arrangement.

The stacked structure ST may include a first region R1 contacting thefirst slit insulating layer SLI1, a second region R2 contacting thesecond slit insulating layer SLI2, and a third region R3 between thefirst region R1 and second region R2. In this connection, the firstpillars P1 may pass through the first region R1; the fourth pillars P4may pass through the second region R2; and the second and third thepillars may run through the third region R3 of the stacked structure ST.Further, the first pillars P1 may be located at boundary between thefirst region R1 and third region R3; the fourth the pillars P4 may belocated at a boundary between the second region R2 and third region R3;and the second and third pillars P2, P3 may be disposed in the thirdregion R3.

The first deposition inhibiting patterns 23A may be disposedrespectively between the conductive layers 21 and insulating layers 22in the first region R1. The second deposition inhibiting patterns 23Bmay be disposed respectively between the conductive layers 21 andinsulating layers 22 in the second region R2.

Referring to FIG. 3D, each of the first deposition inhibiting patterns23A may surround a portion of a side-wall of each of the first pillarsP1. In this connection, the portion of the side-wall may refer to aside-wall portion facing the first slit insulating layer SLI1. That is,each of the first deposition inhibiting patterns 23A may not be formedalong a portion of the side-wall of each of the first pillars P1 facingthe second pillars P2 adjacent thereto in the second direction II-II′.

Each of the second deposition inhibiting patterns 23B may surround aportion of a side-wall of each of the fourth pillars P4. In thisconnection, the portion of the side-wall may refer to a side-wallportion facing the second slit insulating layer SLI2. That is, each ofthe second deposition inhibiting patterns 23 b may not be formed along aportion of the side-wall of each of the fourth pillars P4 facing thethird pillars P3.

Further, each of the first and second deposition inhibiting patterns 23Aand 23B may not be formed along each of the side-walls of the second andthird the pillars P2, and P3.

FIG. 4A is a cross-sectional view of the semiconductor device inaccordance with one implementation of the present disclosure. FIG. 4B isa plan view taken along the line III-III′ of FIG. 4A; FIG. 4C is a planview taken along the line IV-IV′ of FIG. 4A. Hereinafter, descriptionsof the same or similar elements as in the previous descriptions may beomitted.

Referring to FIG. 4A to FIG. 4C, the first pillars P1 may be disposed ina stacked structure ST in the first region R1; the fourth pillars P4 maybe disposed in the stacked structure ST in the second region R2; and thesecond and third pillars P2 and P3 may be disposed in the stackedstructure ST in the third region R3. Each of first deposition inhibitingpatterns 23A may surround an entirety of a side-wall of each of thefirst pillars P1. Each of second deposition inhibiting patterns 23B maysurround an entirety of a side-wall of each of the fourth pillars P4.Further, each of the first and second deposition inhibiting patterns 23Aand 23B may be disposed between each of the conductive layers 21 andeach of barrier patterns 24.

FIG. 5A to FIG. 10A and FIG. 5B to FIG. 10B illustrate a method ofmanufacturing the semiconductor device in accordance with oneimplementation of the present disclosure. Each of FIGS. 5A-10A indicatesa cross-sectional view, and each of FIGS. 5B-10B indicates a plan view.

Referring to FIG. 5A and FIG. 5B, sacrificial layers 31 and insulatinglayers 32 may be alternately disposed. In this connection, thesacrificial layers 31 may have a higher etching selection rate than theinsulating layers 32. In one example, the sacrificial layers 31 mayinclude nitride or the like, while the insulating layers 32 may includeoxide or the like.

Subsequently, pillars 33 may extend through the sacrificial layers 31and insulating layers 32. In one example, after forming through-holespassing through the sacrificial layers 31 and insulating layers 32, thethrough-holes may be filled with the pillars 33. In this connection, thepillars 33 may be embodied as semiconductor patterns 33B. In this case,prior to the formation of the semiconductor patterns 33B, along and onthe inner surface of the through-holes, a memory layer 33A may beformed. The memory layer 33A may include a charge blocking layer, a datastorage layer and/or a tunnel insulating layer. The data storage layermay be made of silicon, nitride, nano-dots, phase-transformationmaterial or the like.

Referring to FIG. 6A and FIG. 6B, slits SL may be formed to pass throughthe sacrificial layers 31 and insulating layers 32. In this connection,the slits SL may be disposed between the pillars 33 and may have a lineshape extension in one direction.

In this connection, the sacrificial layers 31 may be removed through theslits SL to form openings OP. Through the openings OP, the pillars 33 ormemory layer may be exposed. In one example, when the sacrificial layers31 include nitride, the sacrificial layers 31 may be selectively removedusing a phosphoric-acid dip out process.

Next, a barrier layer 34 may be formed along and on exposed surfaces ofthe insulating layers 32 through the openings OP. The barrier layer 34may be further formed along and on exposed side-walls or memory layers,of the pillars 33 through the openings OP. The barrier layer 34 may havea thickness so as to incompletely fill the opening OP. The barrier layer34 may include tantalum Ta, titanium Ti, tantalum nitride TaN, titaniumnitride TiN, or the like. Prior to the formation of the barrier layer34, a memory layer may be formed in the openings OP. The memory layermay include a charge blocking layer, a data storage layer, and/or atunnel insulating layer. The data storage layer may include silicon,nitride, nano-dots, phase-transformation material, or the like.

Referring to FIG. 7A and FIG. 7B, a deposition inhibiting layer 35 maybe formed on an exposed surface of the barrier layer 34 through theopenings OP. In this connection, the deposition inhibiting layer 35 maybe formed on a portion of the exposed surface of the barrier layer 34through the openings OP using a poor step-coverage approach. In oneexample, the deposition inhibiting layer 35 may be formed on only aportion of the exposed surface of the barrier layer 34 which is adjacentto the slit SL.

In this embodiment where the pillars 33 may have a staggeredarrangement, the pillars 33 may be closer to one slit SL than the otherslit SL Both slits SLs are disposed respectively at both sides of thestack. Thus, when a single stack includes three or more pillar rows, thedeposition inhibiting layer 35 may be formed on the side-wall of each ofouter pillars 33 which are relatively closer to the slit SL, while thedeposition inhibiting layer 35 may not be formed on the side-wall ofeach of inner pillars 33 which are relatively more distant from the slitSL.

In one example, regions in which the deposition inhibiting layer 35 isformed may be controlled by adjusting a gas flow rate, temperature,pressure, processing time, or the like during the process of forming thedeposition inhibiting layer 35. The deposition inhibiting layer 35 maybe formed on only side-walls of pillars 33 which are adjacent to theslit SL. Alternatively, the deposition inhibiting layer 35 may be formedto surround entire surfaces of the side-walls of the pillar 33 which arenext to the slit SL, or only portions of the surfaces of the side-wallsof the pillars 33 which face the slit SL.

The deposition inhibiting layer 35 may be formed using a N2 plasmaprocess, an 02 plasma process, or the like, and may include nitride,oxide, or the like. In one example, in case of using the N2 plasmaprocess, a nitride layer may be formed on the barrier layer 34. In caseof using the 02 plasma process, an oxide layer may be formed on thebarrier layer 34. The deposition inhibiting layer 35 formation processmay be executed at a temperature ranging from room temperature to 500°C. Moreover, the deposition inhibiting layer 35 may have a thicknessthat incompletely fills the openings OP. In one example, the thicknessmay include 1 to 100 Å.

Referring to FIG. 8A and FIG. 8B, conductive layers 36A may be depositedon the barrier layer 34 region which is not covered by the depositioninhibiting layer 35. The surface of the barrier layer 34 may serve as anucleation site, while the surface of the deposition inhibiting layer 35may not serve as a nucleation site. Therefore, the surface of thedeposition inhibiting layer 35 may have a less adhesive force than thesurface of the barrier layer 34. In this connection, the conductivelayers 36A may not be deposited on the deposition inhibiting layer 35but may be deposited on the barrier layer 34. This may result in aselective deposition. Between the pillars 33 facing each other in thesecond direction II-II′, there may be deposited the conductive layers36A. Between each of the pillars 33 and each of the slits SL in thesecond direction II-II′, there may not be deposited the conductivelayers 36A. In this way, the conductive layers 36A may be filled in theopenings OP, that is, in the space between the pillars 33. In thisconnection, the conductive layers 36A may be a metal. In one example,the metal may include tungsten W, tungsten nitride WNx, or the like.

Referring to FIG. 9A and FIG. 9B, conductive layers 36B may be depositedto completely fill the openings OP. At this time, since a metal materialmay be deposited on the surface of the previously-formed conductivelayers 36A, the conductive layers 36B may be formed on the depositioninhibiting layers 35 regions. Further, using a deposition process, theconductive layers 36B may be formed on an inner surface of the slit SL.

Referring to FIG. 10A and FIG. 10B, a removal of the barrier layer 34,deposition inhibiting layer 35, and conductive layers 36B in the slit SLmay be carried out. Via this removal, inter-separated barrier patterns34A, deposition inhibiting patterns 35A, and conductive patterns 36C maybe formed. In this connection, each of the barrier patterns 34A maysurround a side-wall of each of the pillars 33 and each of theinsulating layers 32. Each of the deposition inhibiting patterns 35A maysurround at least a portion of a side-wall of each of the pillars andmay be disposed between each of the conductive patterns 36C and each ofthe insulating layers 32. Further, each of the conductive patterns 36Cmay surround each of the pillars 33. Each of the conductive patterns 36Cmay contact a portion of each of the barrier patterns 34A and maycontact a portion of each of the deposition inhibiting patterns 35A.

Thereafter, a slit insulating layer 37 may fill the slits SL. The slitinsulating layer 37 may include oxide. An air-gap may be formed in theslit insulating layer 37.

According to the above manufacturing method, since the conductivematerial may start to be deposited from a deep inner portion of each ofthe openings OP, there may result in compact conductive patterns 36Cwithout voids. The compact conductive patterns 36C may serve as the gateelectrode of the memory cell, selection transistor, etc. Since thecompact conductive pattern 36C may be formed without a void, a memorycell, a selection transistor, etc. including the compact conductivepattern 36C can have a uniform property.

FIG. 11A, FIG. 11B, FIG. 12A and FIG. 12B illustrate a method formanufacturing the semiconductor device in accordance with oneimplementation of the present disclosure. Each of FIGS. 11A and 12Ashows a cross-sectional view. Each of FIGS. 11B and 12B shows a planview. Hereinafter, descriptions of the same or similar elements asdescribed above may be omitted.

Referring to FIG. 11A and FIG. 11B, on each of the barrier layers 34,there may be formed each of seed layers 38. In this connection, the seedlayer 38 may serve as a nucleation site for a subsequent conductivelayer formation. At a nucleation site, the conductive layer mayselectively grow from the seed layer 38. A portion of the seed layer 38covered by the deposition inhibiting layer 35 may not contact a sourcegas, and, thus, the conductive layer may not grow from and on thatportion. In this manner, a conductive layer growth location may becontrolled.

The seed layer 38 may be made of the same material as a conductive layerwhich will be formed at a later stage. In one example, the seed layer 38may include tungsten W, tungsten nitride WNx or the like. It may benoted that the barrier layers 34 may be omitted and only the seed layers38 may be formed.

Thereafter, on the seed layer 38, there may be disposed a depositioninhibiting layer 35. In one example, when using a N2 plasma process, thedeposition inhibiting layer 35 may be formed. As a result, thedeposition inhibiting layer 35 including a tungsten nitride layer WNxmay be formed on the seed layer 38. When an O2 plasma process is used,the deposition inhibiting layer 35 including a tungsten oxide layer WOxmay be formed on the seed layer 38.

Next, the conductive layer 36A may be grown from and on the seed layer38 exposed through the deposition inhibiting layer 35. Since theconductive layer 36A may be grown using the seed layer 38 as anucleation site, the conductive layer 36A may not be grown on and fromthe deposition inhibiting layer 35.

Referring to FIG. 12A and FIG. 12B, conductive patterns 36C may beformed via the growth of the conductive layers 36A. When, the conductivepatterns 36C are formed in this way, the conductive layer may beselectively grown in the openings OP. This may lead to a prevention of abridge between the stacked conductive patterns 36C.

Next, the seed layers 38, deposition inhibiting layers 35, and barrierlayers 34 are trimmed to form seed patterns 38A, deposition inhibitingpatterns 35A, and barrier patterns 34A, respectively. It may be notedthat when the conductive layers are formed in the slits SL, theseconductive layers may be removed at the same time when the seed layers38, deposition inhibiting layers 35, and barrier layers 34 are trimmed.

According to the above-mentioned process where, prior to the formationof the deposition inhibiting layer 35, the seed layer 38 may be formedand the conductive layers 36A may be effectively formed into theopenings OP. Further, by controlling of the growth of the conductivepatterns 36C only into the openings OP, a process of dividing aconductive pattern 36C is not necessary.

The present disclosure is not limited to this implementation, in which amethod for manufacturing the semiconductor device is described above inconnection with figures FIG. 1A to FIG. 1D. The number of the pillars33, arrangements of the pillars 33, and/or a location of the depositioninhibiting layer 35 may have variations in other embodiments. In thisconnection, the semiconductor devices as above-mentioned in connectionwith FIG. 2A to FIG. 4C may be manufactured in accordance withprinciples of the present disclosure.

FIG. 13 is a block diagram of a memory system in accordance with oneimplementation of the present disclosure. Referring to FIG. 13, a memorysystem 1000 in accordance with one implementation of the presentdisclosure may include memory device 1200 and controller 1100.

The memory device 1200 may be used to store data information in varioustypes such as a text, graphic, software code, etc. The memory device1200 may be implemented in a nonvolatile memory, and may include theconfigurations as above-addressed in connection to FIG. 1A to FIG. 12B.Further, the memory device 1200 may include first and second slitinsulating layers, each slit insulating layer extending in a firstdirection; a stacked structure including conductive layers andinsulating layers which are alternately stacked, and disposed betweenthe first and second slit insulating layers, wherein the stackedstructure includes first, second, and third regions, wherein the firstregion contacts the first slit insulating layer, wherein the secondregion contacts the second slit insulating layer, wherein the thirdregion is defined between the first region and the second region; aplurality of first pillars arranged in the first direction, each firstpillar passing through the first region of the stacked structure; aplurality of second pillars arranged in the first direction, each secondpillar passing through the second region of the stacked structure; and aplurality of first deposition inhibiting patterns, each first depositioninhibiting pattern being disposed between each of the conductive layersand each of the insulating layers in the first region, each firstdeposition inhibiting pattern surrounding at least a portion of aside-wall of each of the first pillars. The memory device 1200 may havethe same configuration and may be formed by the same manufacturingmethod as described above.

The controller 1100 may be coupled to a host and the memory device 1200,and may be configured to access the memory device 1200 in response to arequest from the host. For example, the controller 1100 may beconfigured to control reading, writing, erasing, background operationsof the memory device 1200, or the like.

The controller 1100 may include a RAM (Random Access Memory; 1110), CPU(Central Processing Unit; 1120), host interface 1130, ECC circuit (ErrorCorrection Code Circuit; 1140), memory interface 1150 or the like.

In this connection, RAM 1110 may be employed as a work memory for theCPU 1120, as a cache memory between the memory device 1200 and host, asa buffer memory between the memory device 1200 and host, and so on. Itmay be noted that the RAM 1110 may be replaced with SRAM (Static RandomAccess Memory), ROM (Read Only Memory), etc.

The CPU 1120 may be configured to control all of operations of thecontroller 1100. In one example, the CPU 1120 may be configured tooperate firmware such as Flash Translation Layer (FTL) stored in the RAM1110.

The host interface 1130 may interface with the host. In one example, thecontroller 1100 may communicate with the host over at least one ofvarious interface protocols such as USB (Universal Serial Bus) protocol,MMC (Multi-Media Card) protocol, PCI (Peripheral ComponentInterconnection) protocol, PCI-E (PCI-Express) protocol, ATA (AdvancedTechnology Attachment) protocol, Serial-ATA protocol, Parallel-ATAprotocol, SCSI (Small Computer Small Interface) protocol, ESDI (EnhancedSmall Disk Interface) protocol, and IDE (Integrated Drive Electronics)protocol, private protocol, or the like.

The error correction code block 1140 may be configured to detect andcorrect an error in data received from the semiconductor memory device1200 using an error correction code ECC.

The memory interface 1150 may interface with the semiconductor memorydevice 1200. For example, the memory interface may include a NANDinterface or a NOR interface.

It may be noted that the controller 1100 may further include a buffermemory (not shown) to temporarily store data. In this connection, thebuffer memory may temporarily store data to be sent to an externaldevice via the host interface 1130, or may temporarily store data to besent from the memory device 120 via the memory interface 1150. Further,although not shown in the figure, the controller 1100 of the memorysystem according to the present disclosure may further include a ROM(not shown) to store code data to interface with the host system orhost.

The memory system 1000 in accordance with one implementation of thepresent disclosure may include the memory device 1200 having a stablestructure and an enhanced integration which may allow for an improvedintegration of the memory system 1000.

FIG. 14 is a block diagram of a memory system in accordance with oneimplementation of the present disclosure. Hereinafter, description ofthe same or similar elements as mentioned in the previous descriptionmay be omitted.

As shown in FIG. 14, the memory system 1000′ in accordance with oneimplementation of the present disclosure may include a memory device1200′ and controller 1100. Further, the controller 1100 may include aRAM 1110, CPU 1120, host interface 1130, ECC circuit 1140, memoryinterface 1150, or the like.

The memory device 1200′ may be implemented in a nonvolatile memory andmay include the configurations as referenced above in connection tofigures FIG. 1A to FIG. 12B. Further, the memory device 1200′ mayinclude first and second slit insulating layers, each slit insulatinglayer extending in a first direction; a stacked structure includingconductive layers and insulating layers which are alternately stacked,and disposed between the first and second slit insulating layers,wherein the stacked structure includes first, second, and third regions,wherein the first region contacts the first slit insulating layer,wherein the second region contacts the second slit insulating layer,wherein the third region is defined between the first region and thesecond region; a plurality of first pillars arranged in the firstdirection, each first pillar passing through the first region of thestacked structure; a plurality of second pillars arranged in the firstdirection, each second pillar passing through the second region of thestacked structure; and a plurality of first deposition inhibitingpatterns, each first deposition inhibiting pattern being disposedbetween each of the conductive layers and each of the insulating layersin the first region, each first deposition inhibiting patternsurrounding at least a portion of a side-wall of each of the firstpillars. The memory device 1200′ may have the same configuration and maybe formed using the same manufacturing method described above.

Further, the memory device 1200′ may be implemented in a multi-chippackage composed of a plurality of memory chips. The plurality of memorychips may be divided to a plurality of groups. The plurality of groupsmay communicate respectively via first to k-th channels CH1 to CHk withthe controller 1100. Each group may be configured to communicate via asingle common channel with the controller 1100. In another embodiment, asingle channel may be assigned to a single memory chip.

The memory system 1000′ in accordance with one implementation of thepresent disclosure may include the memory device 1200′ with a stablestructure and an enhanced integration which may allow for an improvedintegration of the memory system 1000′. By having the multi-chip packageconfiguration of the memory device 1200′, the memory system 1000′ mayhave an increased data storage capacity, and a higher operation rate.

FIG. 15 is a block diagram of a computing system in accordance with oneimplementation of the present disclosure. Hereinafter, description ofthe same or similar elements as described above may be omitted.

Referring to FIG. 15, a computing system 2000 in accordance with oneimplementation of the present disclosure may include a memory device2100, CPU 2200, RAM 2300, user interface 2400, power-supply 2500, systembus 2600, or the like.

The memory device 2100 may store data supplied via the user interface2400, data processed by the CPU 2200, or/and the like. Further, thememory device 2100 may be electrically coupled, via the system bus 2600,to the CPU 2200, RAM 2300, user interface 2400, power-supply 2500, etc.In one example, the memory device 2100 may be coupled via the controller(not shown) to the system bus 2600, or may be directly coupled to thesystem bus 2600. When the memory device 2100 is directly connected tothe system bus 2600, the function of the controller may be carried outby the CPU 2200, RAM 2300 etc.

The memory device 2100 may be implemented in a nonvolatile memory andmay include the configurations as described above in connection tofigures FIG. 1A to FIG. 12B. Further, the memory device 2100 may includefirst and second slit insulating layers, each slit insulating layerextending in a first direction; a stacked structure including conductivelayers and insulating layers which are alternately stacked, and disposedbetween the first and second slit insulating layers, wherein the stackedstructure includes first, second, and third regions, wherein the firstregion contacts the first slit insulating layer, wherein the secondregion contacts the second slit insulating layer, wherein the thirdregion is defined between the first region and the second region; aplurality of first pillars arranged in the first direction, each firstpillar passing through the first region of the stacked structure; aplurality of second pillars arranged in the first direction, each secondpillar passing through the second region of the stacked structure; and aplurality of first deposition inhibiting patterns, each first depositioninhibiting pattern being disposed between each of the conductive layersand each of the insulating layers in the first region, each firstdeposition inhibiting pattern surrounding at least a portion of aside-wall of each of the first pillars. The memory device 2100 may havethe same configuration and may be formed using a manufacturing method asdescribed above.

Further, the memory device 2100 may be implemented in a multi-chippackage composed of a plurality of memory chips as in FIG. 14.

In one embodiment, the computing system 2000 may include a computer,UMPC (Ultra Mobile PC), workstation, net-book, PDA (Personal DigitalAssistants), portable computer, web tablet, wireless phone, mobilephone, smart phone, e-book, PMP (portable multimedia player), portablegame player, navigation device, black box, digital camera, 3-dimensionaltelevision, digital audio recorder, digital audio player, digitalpicture recorder, digital picture player, digital video recorder,digital video player, a device with a wireless data communication, atleast one electronic device such as a home networking component, atleast one electronic device such as a computer networking component, atleast one electronic device such as a telematics networking component, aRIFD device, or the like.

The computing system 2000 in accordance with one implementation of thepresent disclosure may include the memory device 2100 having a stablestructure and an enhanced integration which may allow for an improvedintegration of the computing system 2000. By having the multi-chippackage configuration of the memory device 2100, the computing system2000 may have an increased data storage capacity and a higher operationrate.

FIG. 16 is a block diagram of a computing system in accordance with oneimplementation of the present disclosure. Referring to FIG. 16, acomputing system 3000 in accordance with one implementation of thepresent disclosure may include a software layer such as an operatingsystem 3200, application 3100, file system 3300, a translation layer3400 or the like. Further, the computing system 3000 may include ahardware layer such as a memory device 3500, etc.

The operating system 3200 may be configured to manage software and/orhardware resources or the like of the computing system 3000 and maycontrol a program execution via the CPU (central processing unit). Theapplication 3100 may be implemented in various application programsexecuted in the computing system 3000, including utilities executed bythe operating system 3200.

The file system 3300 may refer to a logical structure to manage data,file or the like present in the computing system 3000 and may organizefiles or data to be stored in the memory device 3500, etc. based onrules. The file system 3300 may be determined depending on the operatingsystem 3200 running on the computing system 3000. In one example, whenthe operating system 3200 is implemented as a Windows series provided byMicrosoft corporation, the file system 3300 may include FAT (FileAllocation Table), NTFS (NT file system) etc. Otherwise, when theoperating system 3200 is implemented as a Unix/Linux series, the filesystem 3300 may include an EXT (extended file system), UFS (Unix FileSystem), JFS (Journaling File System) etc.

Although the operating system 3200, application 3100 and file system3300 are shown in individual blocks respectively in this figure, theapplication 3100 and file system 3300 may be incorporated in theoperating system 3200.

The translation layer 3400 may translate an address into a formatcompatible with the memory device 3500 in a response to a request fromthe file system 3300. In one example, the translation layer 3400 maytranslate a logical address generated from the file system 3300 to aphysical address of the memory device 3500. In this connection, mappingsbetween the logical address and physical address may be stored in anaddress translation table. In one example, the translation layer 3400may be implemented as a Flash Translation Layer; FTL, Universal FlashStorage Link Layer, ULL, or the like.

The memory device 3500 may be implemented as a nonvolatile memory andmay include the configurations as described above in connection tofigures FIG. 1A to FIG. 12B. Further, the memory device 3500 may includefirst and second slit insulating layers, each slit insulating layerextending in a first direction; a stacked structure including conductivelayers and insulating layers which are alternately stacked, and disposedbetween the first and second slit insulating layers, wherein the stackedstructure includes first, second, and third regions, wherein the firstregion contacts the first slit insulating layer, wherein the secondregion contacts the second slit insulating layer, wherein the thirdregion is defined between the first region and the second region; aplurality of first pillars arranged in the first direction, each firstpillar passing through the first region of the stacked structure; aplurality of second pillars arranged in the first direction, each secondpillar passing through the second region of the stacked structure; and aplurality of first deposition inhibiting patterns, each first depositioninhibiting pattern being disposed between each of the conductive layersand each of the insulating layers in the first region, each firstdeposition inhibiting pattern surrounding at least a portion of aside-wall of each of the first pillars. The memory device 3500 may havethe same confirmation and may be formed using a manufacturing method asdescribed above.

The computing system 3000 may be divided into an operation system layercorresponding to an upper level region and a controller layercorresponding to a lower level region. In this connection, theapplication 3100, operating system 3200 and file system 3300 may bedefined in the operating system layer and may be associated with a workmemory for the computing system 3000. Further, the translation layer3400 may be defined either in the operating system layer or in thecontroller layer.

The computing system 3000 in accordance with one implementation of thepresent disclosure may include the memory device 3500 having a stablestructure and an enhanced integration which may allow for an improvedintegration of the computing system 3000. Thus, the computing system3000 may have an increased data storage capacity.

The above description is not limiting, but is made merely for thepurpose of describing the general principles of exemplary embodiments,and many additional embodiments of this disclosure are possible. It isunderstood that no limitation of the scope of the disclosure is therebyintended. The scope of the disclosure should be determined withreference to the Claims. Reference throughout this specification to “oneembodiment,” “an embodiment,” or similar language means that aparticular feature, structure, or characteristic that is described inconnection with the embodiment is included in at least one embodiment ofthe present disclosure. Thus, appearances of the phrases “in oneembodiment,” “in an embodiment,” and similar language throughout thisspecification may, but do not necessarily, all refer to the sameembodiment.

What is claimed is:
 1. A semiconductor device comprising: first andsecond slit insulating layers, each slit insulating layer extending in afirst direction; a stacked structure including conductive layers andinsulating layers, which are alternately stacked, and disposed betweenthe first and second slit insulating layers, wherein the stackedstructure includes first, second, and third regions, wherein the firstregion contacts the first slit insulating layer, wherein the secondregion contacts the second slit insulating layer, wherein the thirdregion is defined between the first region and the second region; aplurality of first pillars arranged in the first direction, each firstpillar passing through the first region of the stacked structure; aplurality of second pillars arranged in the first direction, each secondpillar passing through the second region of the stacked structure; and aplurality of first deposition inhibiting patterns, each first depositioninhibiting pattern being disposed between each of the conductive layersand each of the insulating layers in the first region, each firstdeposition inhibiting pattern surrounding at least a portion of aside-wall of each of the first pillars, wherein each of the conductivelayers is thicker in the third region than the first region.
 2. Thedevice of claim 1, wherein the first and second pillars adjacent to eachother in a second direction have a staggered arrangement, the seconddirection crossing the first direction.
 3. The device of claim 2,further comprising: a plurality of second deposition inhibitingpatterns, each second deposition inhibiting pattern being disposedbetween each of the conductive layers and each of the insulating layersin the second region, each second deposition inhibiting patternsurrounding at least a portion of a side-wall of each of the secondpillars.
 4. The device of claim 1, further comprising: a plurality ofthird pillars arranged in the first direction, each third pillar passingthrough the stacked structure in the third region; and a plurality offourth pillars arranged in the first direction, each fourth pillarpassing through the stacked structure in the third region; wherein thefirst and third pillars are adjacent to each other in a second directionand have a staggered arrangement, the second direction crossing thefirst direction; and wherein the second and fourth pillars are adjacentto each other in the second direction and have a staggered arrangement.5. The device of claim 1, wherein the first pillars are located in thefirst region, and wherein each of the first deposition inhibitingpatterns surrounds an entirety of a side-wall of each of the firstpillars.
 6. The device of claim 1, wherein the first pillars are locatedat a boundary between the first and third regions, and wherein each ofthe first deposition inhibiting patterns surrounds only a portion of aside-wall of each of the first pillars.
 7. The device of claim 6,wherein the portion of the side-wall of each of the first pillars whichis surrounded by each first deposition inhibiting pattern faces thefirst slit insulating layer.
 8. The device of claim 1, wherein each ofthe first deposition inhibiting patterns includes nitrogen or oxygen. 9.The device of claim 1, further comprising: barrier patterns surroundingthe conductive layers, respectively, wherein the first depositioninhibiting patterns are interposed between the barrier patterns and theconductive layers in the first region.
 10. The device of claim 9,further comprising: seed patterns surrounding the conductive layers,respectively, wherein the seed patterns are interposed between thebarrier patterns and the conductive layers in the third region andbetween the barrier patterns and the first deposition inhibitingpatterns in the first region.
 11. The device of claim 1, wherein thefirst deposition inhibiting patterns include nitrogen or oxygen.